Circuits over monoids: A fault model, and a trade-off between testability and circuit delay (Q1195687)
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scientific article; zbMATH DE number 85877
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Circuits over monoids: A fault model, and a trade-off between testability and circuit delay |
scientific article; zbMATH DE number 85877 |
Statements
Circuits over monoids: A fault model, and a trade-off between testability and circuit delay (English)
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5 January 1993
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fault model
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evaluation circuits
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prefix circuits
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transformation monoid
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