Pages that link to "Item:Q421367"
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The following pages link to Recovery of an interface from boundary measurement in an elliptic differential equation (Q421367):
Displaying 7 items.
- Identification of contact regions in semiconductor transistors by level-set methods (Q1414315) (← links)
- Analytic extension and reconstruction of obstacles from few measurements for elliptic second order operators (Q1938075) (← links)
- Recovery of nonlinear terms for reaction diffusion equations from boundary measurements (Q2678943) (← links)
- (Q4313043) (← links)
- Recovering density for the Mindlin–Timoshenko system by means of a single boundary measurement (Q5072138) (← links)
- Detecting Interfaces in a Parabolic‐Elliptic Problem from Surface Measurements (Q5386200) (← links)
- Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach (Q5856186) (← links)