Pages that link to "Item:Q664976"
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The following pages link to Computer simulation of charging the silicon dioxide surface and subsurface layers by electron bombardment (Q664976):
Displaying 4 items.
- 1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. I: Computation of the initial secondary electron emission yield (Q534885) (← links)
- Photoelectron emission from implanted \(SiO_{2}: Se^{+}\) films (Q662787) (← links)
- Methodological aspects of the electron-beam investigation of dielectric target charging (Q664009) (← links)
- The surface charging effects in three-dimensional simulation of the profiles of plasma-etched nanostructures (Q2889645) (← links)
