Pages that link to "Item:Q828193"
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The following pages link to Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs (Q828193):
Displaying 5 items.
- Circuits over monoids: A fault model, and a trade-off between testability and circuit delay (Q1195687) (← links)
- On self-correcting logic circuits of unreliable gates with at most two inputs (Q2113411) (← links)
- Some classes of easily testable circuits in the Zhegalkin basis (Q2688833) (← links)
- Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements (Q3057821) (← links)
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates (Q6494792) (← links)
