Pages that link to "Item:Q831000"
From MaRDI portal
The following pages link to Tests with stuck-at and shift faults on circuit inputs (Q831000):
Displaying 8 items.
- Complete tests relative to displacing faults of inputs of circuits (Q493886) (← links)
- On estimates of Shannon functions of the length of unit tests for transpositions of variables (Q1037100) (← links)
- Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073) (← links)
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits (Q2050225) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults (Q3331145) (← links)
- On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits (Q6084899) (← links)
- On diagnostic test sets for local mirror reflections on circuit inputs (Q6576768) (← links)