Pages that link to "Item:Q840486"

The following pages link to Modal interactions in contact-mode atomic force microscopes (Q840486):

Displaying 12 items.

• Output feedback control of piezoelectrically actuated non-classical micro-beams using T-S fuzzy model (Q509378) (← links)
• The effect of vibrations of the base of a tunnel microscope on the deviation of the program motion of a probe (Q734032) (← links)
• Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance (Q840501) (← links)
• Variational treatment of electrostatic interaction force in atomic force microscopy (Q957851) (← links)
• Measurement error of a coupled AFM probe-elastic membrane system (Q1720654) (← links)
• Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model (Q2134375) (← links)
• Effect of contact stiffness modulation in contact-mode AFM under subharmonic excitation (Q2257447) (← links)
• Sensitivity vector fields for atomic force microscopes (Q2380539) (← links)
• Development of a mathematical model and analytical solution of a coupled two-beam array with nonlinear tip forces for application to AFM (Q2411226) (← links)
• Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials (Q3043474) (← links)
• (Q5506508) (← links)
• Inner-Paddled Microcantilever for Multi-modal and Nonlinear Atomic Force Microscopy (Q6487248) (← links)