Pages that link to "Item:Q1816073"
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The following pages link to Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073):
Displaying 5 items.
- Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults (Q792959) (← links)
- A regular method for test sequence design. Correctness of the checking sequence (Q792963) (← links)
- Decoding the results of diagnosing experiments in an asynchronous device with memory (Q800316) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults (Q3331145) (← links)