Pages that link to "Item:Q2332897"
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The following pages link to Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897):
Displaying 17 items.
- Single tests for logical gates (Q314165) (← links)
- On the length of diagnostic tests for Boolean circuits (Q679884) (← links)
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs (Q828193) (← links)
- The length of a single fault detection test for constant-nonpreserving element insertions (Q830998) (← links)
- Single fault detection tests for generalized iterative switching circuits (Q887392) (← links)
- Efficient VLSI fault simulation (Q1203708) (← links)
- Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
- Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073) (← links)
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder (Q2096002) (← links)
- The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
- On self-correcting logic circuits of unreliable gates with at most two inputs (Q2113411) (← links)
- The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (Q2135320) (← links)
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases (Q2136299) (← links)
- On self-correcting logic circuits of unreliable gates (Q2241352) (← links)
- Single fault diagnostic tests for inversion faults of circuit elements over some bases (Q2319832) (← links)
- (Q3696841) (← links)
