Pages that link to "Item:Q2741790"
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The following pages link to Noise in semiconductor devices. Modeling and simulation (Q2741790):
Displaying 8 items.
- 1/f noise under drift and thermal agitation in semiconductor materials (Q2669405) (← links)
- An individual particle approach to noise in pseudomorphic heterojunction field effect transistors (Q2740859) (← links)
- A tabular source approach to modelling and simulating device and circuit noise in the time domain (Q2889648) (← links)
- Collective Poisson process with periodic rates: applications in physics from micro-to nanodevices (Q2997321) (← links)
- HEMT noise neural model based on bias conditions (Q3156134) (← links)
- Integrated deterministic and stochastic simulation of electronic circuits: Application to large signal-noise analysis (Q3541236) (← links)
- Localization and quantification of noise sources in four‐gate field‐effect‐transistors (Q3585576) (← links)
- (Q4459787) (← links)
