Localization and quantification of noise sources in four‐gate field‐effect‐transistors (Q3585576)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Localization and quantification of noise sources in four‐gate field‐effect‐transistors |
scientific article |
Statements
Localization and quantification of noise sources in four‐gate field‐effect‐transistors (English)
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20 August 2010
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four-gate transistor
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low frequency noise
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multiple-gate transistor
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two-dimensional (2D) modeling
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junction FET (JFET)
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