Pages that link to "Item:Q2940498"
From MaRDI portal
The following pages link to Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering (Q2940498):
Displaying 7 items.
- Grazing-incidence XRF analysis of layered samples: Detailed study of amplitude calculation (Q312801) (← links)
- Multiobjective optimization in a pseudometric objective space as applied to a general model of business activities (Q519689) (← links)
- On the numerical solution of the inverse problem of \(X\)-ray diffraction optics (Q1842269) (← links)
- Direct and inverse problems of investigating the process of self-focusing of X-ray pulses in plasma (Q2206488) (← links)
- Theoretical concepts of X-ray nanoscale analysis. Theory and applications (Q2438443) (← links)
- The inverse problem of estimating the film structure from X-ray reflection data (Q2458124) (← links)
- Inverse problem for a distributed system from pulse technology (Q6546377) (← links)
