Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering (Q2940498)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering |
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Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering (English)
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26 January 2015
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multilayer nanostructures
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inverse problem
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quasi-optical approximation
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