Pages that link to "Item:Q3081494"

The following pages link to Identification of surface impedance of thin dielectric objects from far-field data (Q3081494):

Displaying 10 items.

• The determination of anisotropic surface impedance in electromagnetic scattering (Q554765) (← links)
• The determination of boundary coefficients from far field measurements (Q610945) (← links)
• Detecting and imaging dielectric objects from real data: a shape-based approach (Q969948) (← links)
• The factorization method for the inverse scattering problem from thin dielectric objects (Q2398153) (← links)
• Mathematical framework for multi-frequency identification of thin insulating and small conductive inhomogeneities (Q2832556) (← links)
• On the reconstruction of surface impedance from the far-field data in inverse scattering problems (Q2883314) (← links)
• A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data (Q4572153) (← links)
• A modified transmission eigenvalue problem for scattering by a partially coated crack (Q4682390) (← links)
• Application of the linear sampling method to identify cracks with impedance boundary conditions (Q5300392) (← links)
• On the Determination of the Boundary Impedance from the Far Field Pattern (Q5392311) (← links)