A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data (Q4572153)
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scientific article; zbMATH DE number 6905373
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data |
scientific article; zbMATH DE number 6905373 |
Statements
A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data (English)
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18 July 2018
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0.79783547
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0.79469997
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0.7834652
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0.7777329
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