Pages that link to "Item:Q3176905"
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The following pages link to Modeling of Electromechanical Contact on a Microscopic Lengthscale (Q3176905):
Displaying 9 items.
- Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method (Q443314) (← links)
- Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model (Q2134375) (← links)
- Modelling and nanoscale force spectroscopy of frequency modulation atomic force microscopy (Q2174373) (← links)
- Effect of geometric characteristics of a cluster of micro-contacts on its mechanical and electrical properties (Q2442616) (← links)
- A two-scale model for an array of AFM's cantilever in the static case (Q2467152) (← links)
- Micro/Nano Mechanics of Contact of Solids (Q2914091) (← links)
- A microscopical model for electric-mechanical contact (Q2955169) (← links)
- Numerical modelling of electrostatic force microscopes considering charge and dielectric constant (Q3627389) (← links)
- Numerical computation of magnetic fields applied to magnetic force microscopy (Q3627390) (← links)