Numerical modelling of electrostatic force microscopes considering charge and dielectric constant (Q3627389)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Numerical modelling of electrostatic force microscopes considering charge and dielectric constant |
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Numerical modelling of electrostatic force microscopes considering charge and dielectric constant (English)
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12 May 2009
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electrostatics
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finite element analysis
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measuring instruments
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nanotechnology
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numerical analysis
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simulation
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