Pages that link to "Item:Q337310"
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The following pages link to Optimized allocation of defect inspection capacity with a dynamic sampling strategy (Q337310):
Displaying 7 items.
- Setting defect charts control limits to balance cycle time and yield for a tandem production line (Q337306) (← links)
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk (Q1751676) (← links)
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information (Q2023984) (← links)
- On the importance of variability when managing metrology capacity (Q2282511) (← links)
- Distributing inspections in space and time -- proposed solution of a difficult problem (Q2356191) (← links)
- (Q4525998) (← links)
- Inspection resource assignment in a multistage manufacturing system with an inspection error model (Q4656114) (← links)