Optimized allocation of defect inspection capacity with a dynamic sampling strategy (Q337310)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Optimized allocation of defect inspection capacity with a dynamic sampling strategy |
scientific article; zbMATH DE number 6650785
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Optimized allocation of defect inspection capacity with a dynamic sampling strategy |
scientific article; zbMATH DE number 6650785 |
Statements
Optimized allocation of defect inspection capacity with a dynamic sampling strategy (English)
0 references
10 November 2016
0 references
semiconductor manufacturing
0 references
linear programming
0 references
capacity planning
0 references
inspections
0 references
wafers at risk
0 references
