The following pages link to Gian Antonio Susto (Q337311):
Displaying 5 items.
- Multi-step virtual metrology for semiconductor manufacturing: a multilevel and regularization methods-based approach (Q337315) (← links)
- Control of PDE-ODE cascades with Neumann interconnections (Q468228) (← links)
- A virtual metrology system based on least angle regression and statistical clustering (Q6570838) (← links)
- Packaging Industry Anomaly DEtection (PIADE) Dataset (Q6707389) (← links)
- Algorithmic Fairness Datasets (Q6707393) (← links)