The following pages link to (Q3525899):
Displaying 11 items.
- 1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. I: Computation of the initial secondary electron emission yield (Q534885) (← links)
- Methodological aspects of the electron-beam investigation of dielectric target charging (Q664009) (← links)
- Computer simulation of charging the silicon dioxide surface and subsurface layers by electron bombardment (Q664976) (← links)
- Monte Carlo simulation of electron dynamics in liquid water (Q1618422) (← links)
- Monte Carlo simulation of the transient response of single photon absorption in X-ray pixel detectors (Q1873068) (← links)
- Monte Carlo modeling of secondary electron emission and its incorporation in particle simulations of electron-surface interaction (Q1943154) (← links)
- EMI2, the counting efficiency for electron capture by a \(KL_1 L_2 L_3 M\) model (Q1961796) (← links)
- Modeling of quartz dielectric spectrum in the region of establishing electron polarization processes (Q2380156) (← links)
- An ``instantaneous'' distribution of the ionization-passive electrons and holes under irradiation of a dielectric by intense electron or laser beams (Q2571592) (← links)
- On the mathematical modelling of multidimensional ion implantation problems (Q2743250) (← links)
- Modeling of experiments for investigation of radiative electron emission (Q2844545) (← links)
