Pages that link to "Item:Q3627389"
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The following pages link to Numerical modelling of electrostatic force microscopes considering charge and dielectric constant (Q3627389):
Displaying 4 items.
- Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method (Q443314) (← links)
- Variational treatment of electrostatic interaction force in atomic force microscopy (Q957851) (← links)
- Electrostatic simulation using XFEM for conductor and dielectric interfaces (Q3018035) (← links)
- Numerical computation of magnetic fields applied to magnetic force microscopy (Q3627390) (← links)