The following pages link to (Q4253306):
Displaying 3 items.
- Analysis on block-centered finite differences of numerical simulation of semiconductor device detector (Q671087) (← links)
- Characteristic difference methods and \(L^\infty\)-error estimates for the semiconductor device of two dimensions (Q2720636) (← links)
- Collocation methods and error analyses for the semiconductor problem (Q2721798) (← links)