Pages that link to "Item:Q4384085"
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The following pages link to A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (Q4384085):
Displaying 8 items.
- Maxx: Test pattern optimisation with local search over an extended logic (Q2460257) (← links)
- Fast test generation for m-logic combinational circuits (Q3481653) (← links)
- (Q3739059) (← links)
- (Q3751514) (← links)
- FsmTest: Functional test generation for sequential circuits (Q4332021) (← links)
- On the role of hardware reset in synchronous sequential circuit test generation (Q4419767) (← links)
- Low-Transition Test Pattern Generation for BIST-Based Applications (Q4589549) (← links)
- Computational analysis of counter-based schemes for VLSI test pattern generation (Q5936462) (← links)