Pages that link to "Item:Q443314"
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The following pages link to Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method (Q443314):
Displaying 5 items.
- Variational treatment of electrostatic interaction force in atomic force microscopy (Q957851) (← links)
- The contribution of the electrostatic proximity force to atomic force microscopy with insulators (Q2478891) (← links)
- Modeling of Electromechanical Contact on a Microscopic Lengthscale (Q3176905) (← links)
- Numerical modelling of electrostatic force microscopes considering charge and dielectric constant (Q3627389) (← links)
- Numerical computation of magnetic fields applied to magnetic force microscopy (Q3627390) (← links)