The following pages link to (Q4530619):
Displaying 16 items.
- A minimum asymptotic mean squared error controller for an IMA(1,1) noise process with a starting offset, and its resetting design (Q634855) (← links)
- Economic design of an integrated process control procedure with repeated adjustments and EWMA monitoring (Q640695) (← links)
- Multiple-input dual-output adjustment scheme for semiconductor manufacturing processes using a dynamic dual-response approach (Q869631) (← links)
- Simulation-based designs for multiperiod control (Q1020776) (← links)
- Optimal control for a linear system subject to a general ARIMA disturbance (Q1666616) (← links)
- Linear filter model representations for integrated process control with repeated adjustments and monitoring (Q2511330) (← links)
- Setup adjustment under unknown process parameters and fixed adjustment cost (Q2581661) (← links)
- An Economic Design of the Bounded Reset Chart Using the Integral Controller for Batch-Oriented Processes (Q2862310) (← links)
- Data transformation in SPC for semiconductor machinery control: A case of monitoring particles (Q3369499) (← links)
- Statistical process adjustment: a brief retrospective, current status, and some opportunities for further work (Q3429867) (← links)
- The effects of model parameter deviations on the variance of a linearly filtered time series (Q3580163) (← links)
- Adjustment rules based on quality control charts† (Q4204983) (← links)
- Identifying the time of step change in the mean of autocorrelated processes (Q5123503) (← links)
- A review of yield modelling techniques for semiconductor manufacturing (Q5444429) (← links)
- Development of Run-To-Run (R2R) controller for the multiple-input multiple-output (MIMO) system using fuzzy control theories (Q5444508) (← links)
- An overview of George Box's contributions to process monitoring and feedback adjustment (Q6570552) (← links)
