Pages that link to "Item:Q4558289"
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The following pages link to Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289):
Displaying 9 items.
- Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults (Q792959) (← links)
- The length of a single fault detection test for constant-nonpreserving element insertions (Q830998) (← links)
- An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits (Q1101421) (← links)
- Testable design of two-dimensional cellular logic arrays for detecting struck-at and bridging faults (Q1119547) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCE (Q3741577) (← links)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two (Q4973245) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
- Friedman's question: Detectability of bridging faults in irredundant computational logic networks (Q5202145) (← links)
