An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits (Q1101421)
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scientific article; zbMATH DE number 4047613
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits |
scientific article; zbMATH DE number 4047613 |
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An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits (English)
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1988
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algorithm
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stuck-at faults
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combinational logic circuits
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fault simulation
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component connection model
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0.92446977
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0.89621663
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0.87613523
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0.87195265
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