Pages that link to "Item:Q4671324"
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The following pages link to Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition (Q4671324):
Displaying 3 items.
- Defect detection in periodically patterned surfaces using independent component analysis (Q937425) (← links)
- A fuzzy AHP-based performance evaluation model for implementing SPC in the Taiwanese LCD industry (Q3055321) (← links)
- Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques (Q4671375) (← links)