Pages that link to "Item:Q4700816"
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The following pages link to A three‐dimensional numerical method for thermal analysis in X‐ray lithography (Q4700816):
Displaying 8 items.
- Mathematical model and computer simulation of three dimensional thin film elliptic interface problems (Q418274) (← links)
- An unconditionally stable finite difference scheme for solving a 3D heat transport equation in a sub-microscale thin film (Q1612401) (← links)
- 3D heat diffusion simulation using 3D and 1D heat sources-temperature and phase contrast results for defect detection using IRT (Q2290059) (← links)
- A finite difference scheme for solving a three-dimensional heat transport equation in a thin film with microscale thickness (Q2709679) (← links)
- A preconditioned Richardson method for solving three‐dimensional thin film problems with first order derivatives and variable coefficients (Q4508222) (← links)
- A compact finite difference scheme for solving a three-dimensional heat transport equation in a thin film (Q4508631) (← links)
- A hybrid finite element‐finite difference method for thermal analysis in X‐ray lithography (Q4952969) (← links)
- A domain decomposition method for solving thin film elliptic interface problems with variable coefficients (Q4953085) (← links)
