Pages that link to "Item:Q4883213"
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The following pages link to Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability (Q4883213):
Displaying 5 items.
- Designing repetitive screening procedures with imperfect inspections: an empirical Bayes approach (Q323229) (← links)
- Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing (Q1011272) (← links)
- Optimal reduction of a spatial monitoring grid: proposals and applications in process control (Q2361216) (← links)
- The effect of testing equipment shift on optimal decisions in a repetitive testing process (Q2462127) (← links)
- Sequential Screening in Semiconductor Manufacturing, I: Exploiting Spatial Dependence (Q4883212) (← links)