Pages that link to "Item:Q920939"
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The following pages link to Partitioning circuits for improved testability (Q920939):
Displaying 7 items.
- Decomposition of discrete devices for testable transformation (Q378373) (← links)
- A graph partitioning heuristic for the parallel pseudo-exhaustive logical test of VLSI combinational circuits (Q1339115) (← links)
- Minimal length test vectors for multiple-fault detection (Q1826631) (← links)
- Graph partitioning applied to the logic testing of combinational circuits (Q1900143) (← links)
- Test-set partitioning for multi-weighted random LFSRs (Q2734608) (← links)
- Die systematische Partionierung digitaler Schaltungen für Testzwecke (Q3992778) (← links)
- Computational Science and Its Applications – ICCSA 2004 (Q5307202) (← links)