Partitioning circuits for improved testability (Q920939)
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scientific article; zbMATH DE number 4164746
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Partitioning circuits for improved testability |
scientific article; zbMATH DE number 4164746 |
Statements
Partitioning circuits for improved testability (English)
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1991
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VLSI circuits
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dynamic programming
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NP-completeness
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self-testing of combinational circuitry
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level-sensitive scan design
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combinational logic
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unconstrained partitioning problem
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0.87444973
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0.8666252
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0.84599733
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0.83920026
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