Repeated significance tests with biased coin allocation schemes (Q1070723)

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scientific article; zbMATH DE number 3938349
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Repeated significance tests with biased coin allocation schemes
scientific article; zbMATH DE number 3938349

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    Repeated significance tests with biased coin allocation schemes (English)
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    1986
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    Suppose that the responses to two treatments are from a single parameter exponential family. Treatments are allocated sequentially using a biased coin design (that is, the probability that the \((n+1)\)-st subject is assigned to treatment A is a function of the proportion of the first n subjects that have been assigned to treatment A). Asymptotic error probabilities are found for a repeated signifance test of the hypothesis that the two treatments elicit the same response.
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    single parameter exponential family
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    biased coin design
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    asymptotic error probabilities
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    repeated significance test
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