Repeated significance tests with biased coin allocation schemes (Q1070723)
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scientific article; zbMATH DE number 3938349
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Repeated significance tests with biased coin allocation schemes |
scientific article; zbMATH DE number 3938349 |
Statements
Repeated significance tests with biased coin allocation schemes (English)
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1986
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Suppose that the responses to two treatments are from a single parameter exponential family. Treatments are allocated sequentially using a biased coin design (that is, the probability that the \((n+1)\)-st subject is assigned to treatment A is a function of the proportion of the first n subjects that have been assigned to treatment A). Asymptotic error probabilities are found for a repeated signifance test of the hypothesis that the two treatments elicit the same response.
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single parameter exponential family
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biased coin design
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asymptotic error probabilities
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repeated significance test
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0.88501316
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0.8589275
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0.84814924
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0.8458535
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0.8412938
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0.83907104
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