Path testing in circuits with functional units (Q1095869)

An algorithm to detect sets of input variable for testing paths in circuits with functional units is proposed which permits the use of the information, obtained from one path, in the test of other paths having common sections with the first one. For this, the given circuit is represented as formed from one-lvel, serial connected subcircuits, called blocks. At different steps of the algorithm only distinct blocks are considered. The correctness of the algorithm is proved and an illustrative example given.