Fault diagnosis under a limited-fault assumption and limited test-point availability (Q1119608)

This paper describes a method of fault diagnosis for large interconnected circuits in which the number of faults is limited to, say, \(n_ f\) where it is possible that \(n_ f\) exceeds the number of output measurements, \(n_ 0\). The problem and its solution are formulated in the context of a frequency domain tableau based on the component connection model of a circuit/system. The paper describes Jacobian tests for diagnosability when \(n_ f\geq n_ 0\) and states a full parameter diagnosability test as a corollary to the main theorem. An algorithm is developed for the identification of faulty parameters in this limited fault case. Finally, examples, including a 26-parameter video-amplifier circuit, illustrating the technique are given.