An investigation of chaos in the \(RL\)-diode circuit using the BDS test (Q1281352)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: An investigation of chaos in the \(RL\)-diode circuit using the BDS test |
scientific article; zbMATH DE number 1267369
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | An investigation of chaos in the \(RL\)-diode circuit using the BDS test |
scientific article; zbMATH DE number 1267369 |
Statements
An investigation of chaos in the \(RL\)-diode circuit using the BDS test (English)
0 references
20 June 1999
0 references
Summary: An \(RL\)-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each \(e\) value.
0 references
0.7163789868354797
0 references
0.6899639964103699
0 references
0.6772160530090332
0 references
0.6724548935890198
0 references
0.6702073812484741
0 references