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Type-I intermittency in semiconductor breakdown-experimental consequences of bifurcations from a toroidal attractor - MaRDI portal

Type-I intermittency in semiconductor breakdown-experimental consequences of bifurcations from a toroidal attractor (Q1312414)

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scientific article; zbMATH DE number 493492
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English
Type-I intermittency in semiconductor breakdown-experimental consequences of bifurcations from a toroidal attractor
scientific article; zbMATH DE number 493492

    Statements

    Type-I intermittency in semiconductor breakdown-experimental consequences of bifurcations from a toroidal attractor (English)
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    9 February 1994
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    semiconductor
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    toroidal attractor
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    fluctuations
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    oscillations
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    ionization breakdown
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    germanium
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    chaos
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    bifurcation
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    Identifiers