Parameter detection of thin films from their X-ray reflectivity by support vector machines. (Q1427212)
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scientific article; zbMATH DE number 2055530
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Parameter detection of thin films from their X-ray reflectivity by support vector machines. |
scientific article; zbMATH DE number 2055530 |
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Parameter detection of thin films from their X-ray reflectivity by support vector machines. (English)
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14 March 2004
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support vector machines
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rReproducing kernel Hilbert spaces
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radial basis functions
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X-ray reflectometry
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optical matrix method
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inverse problem
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reflectivity curves
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thin film
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quadratic programming
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algorithm
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