BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count (Q1433981)
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scientific article; zbMATH DE number 2077763
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count |
scientific article; zbMATH DE number 2077763 |
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BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count (English)
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1 July 2004
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