A theoretical analysis of the electromigration-induced void morphological evolution under high current density (Q1695572)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: A theoretical analysis of the electromigration-induced void morphological evolution under high current density |
scientific article; zbMATH DE number 6835819
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A theoretical analysis of the electromigration-induced void morphological evolution under high current density |
scientific article; zbMATH DE number 6835819 |
Statements
A theoretical analysis of the electromigration-induced void morphological evolution under high current density (English)
0 references
7 February 2018
0 references
electromigration
0 references
analytical solution
0 references
void evolution
0 references
high current density
0 references
mass diffusion
0 references
0 references
0 references
