Self-dual self-testing multicycle circuits: Their properties (Q1778424)
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scientific article; zbMATH DE number 2176763
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Self-dual self-testing multicycle circuits: Their properties |
scientific article; zbMATH DE number 2176763 |
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Self-dual self-testing multicycle circuits: Their properties (English)
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17 June 2005
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memory circuits
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self-dual functions
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MCNC benchmark circuits
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0.8870432
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0.8483373
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0.8418153
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0.8330853
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0.8281771
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0.82416457
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0.8170829
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