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Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements - MaRDI portal

Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements (Q1795348)

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scientific article; zbMATH DE number 6955649
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English
Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements
scientific article; zbMATH DE number 6955649

    Statements

    Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements (English)
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    16 October 2018
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    \(k\)-valued logics function
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    unreliable functional gates
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    reliability and unreliability of circuit
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    synthesis of circuits composed of unreliable gates
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    fault of type 0
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    fault of type \(k-1\)
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