Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring (Q2050836)
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scientific article; zbMATH DE number 7389006
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring |
scientific article; zbMATH DE number 7389006 |
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Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring (English)
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31 August 2021
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reliability
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life testing
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type-II censoring
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type-I error
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type-II error
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