Comparative analysis of the matrix method and the finite-difference method for modeling the distribution of minority charge carriers in a multilayer planar semiconductor structure (Q2098821)
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scientific article; zbMATH DE number 7621844
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Comparative analysis of the matrix method and the finite-difference method for modeling the distribution of minority charge carriers in a multilayer planar semiconductor structure |
scientific article; zbMATH DE number 7621844 |
Statements
Comparative analysis of the matrix method and the finite-difference method for modeling the distribution of minority charge carriers in a multilayer planar semiconductor structure (English)
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22 November 2022
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mathematical model
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differential equation
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electron beam
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semiconductor
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multilayer planar structure
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matrix method
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finite-difference method
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