Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation (Q3015384)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation |
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation |
scientific article |
Statements
Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation (English)
0 references
13 July 2011
0 references
MSM photodetector
0 references
numerical simulation
0 references
semiconductor devices
0 references
dark characteristics
0 references
