Testing cross-talk induced delay faults in digital circuit based on transient current analysis (Q3443178)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Testing cross-talk induced delay faults in digital circuit based on transient current analysis |
scientific article |
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Testing cross-talk induced delay faults in digital circuit based on transient current analysis (English)
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1 June 2007
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delay fault
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cross-talk
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fault localization
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digital circuit
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IDDT
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SVM
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