Simulation of the hot‐carrier degradation in short channel transistors with high‐K dielectric (Q3585578)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Simulation of the hot‐carrier degradation in short channel transistors with high‐K dielectric |
scientific article |
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Simulation of the hot‐carrier degradation in short channel transistors with high‐K dielectric (English)
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20 August 2010
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hot-carrier degradation
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high-k
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reliability
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short channel devices
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0.6363685727119446
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