Test generation for path delay faults using binary decision diagrams (Q4419665)
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scientific article; zbMATH DE number 1964050
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Test generation for path delay faults using binary decision diagrams |
scientific article; zbMATH DE number 1964050 |
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Test generation for path delay faults using binary decision diagrams (English)
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1995
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Boolean algebraic test generation
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redundant delay faults
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robust delay tests
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