BIST test pattern generators for two-pattern testing-theory and design algorithms (Q4420920)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: BIST test pattern generators for two-pattern testing-theory and design algorithms |
scientific article; zbMATH DE number 1966844
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | BIST test pattern generators for two-pattern testing-theory and design algorithms |
scientific article; zbMATH DE number 1966844 |
Statements
BIST test pattern generators for two-pattern testing-theory and design algorithms (English)
0 references
1996
0 references
pseudo-exhaustive testing
0 references
built-in self-test
0 references
