BIST test pattern generators for two-pattern testing-theory and design algorithms

DOI10.1109/12.485565zbMATH Open1055.68518OpenAlexW2088710519MaRDI QIDQ4420920

Sandeep K. Gupta, Chih-Ang Chen

Publication date: 1996

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.485565

zbMATH Keywords

built-in self-testpseudo-exhaustive testing

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Cellular automata (computational aspects) (68Q80) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Related Items (3)

Low-Transition Test Pattern Generation for BIST-Based Applications ⋮ A loop-based apparatus for at-speed self-testing ⋮ Exploiting deterministic TPG for path delay testing

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